User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 10-3
Application Library and Utilities
Application Test Definitions
Application Test Definitions
Agilent EasyEXPERT software contains the application library which supports the
characteristic measurements of CMOS devices, TFT, BJT, diode, resistor, capacitor,
varactor, memory, nanotechnology devices such as CNT FET, and so on. The
application library includes more than one hundred test definitions. And they are
classified into the following categories. Table 10-1 lists all test definitions belonging
to the category. Each test definition requires the modules and instruments shown in
the table.
1. BJT
2. CMOS
3. Discrete
4. Generic Test
5. Memory
6. Mixed Signal
7. Nano Tech
8. Power Device
9. Reliability
10. Structure
11. TFT
12. Utility
13. WGFMU
NOTE Application Library
The application library is a set of test definitions effective for the EasyEXPERT
application test execution mode. The application test can be performed by selecting
a test definition and setting the test condition for the actual DUT (device under test).
And the setup can be saved as the dedicated test setup for the DUT.
All test definitions are just sample. If the samples damage your devices, Agilent
Technologies is NOT LIABLE for the damage.