User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 9-69
If You Have a Problem
Error Codes
3013 EEPROM CRC data of RSU calibration data is invalid.
3014 Invalid EEPROM type.
3400 WGFMU module is in TEST FAIL state.
3401 Digital H/W function test failed.
3402 CPLD access function test failed.
3403 FPGA configuration test failed.
3404 FPGA1 access function test failed.
3405 FPGA2 access function test failed.
3406 FPGA1 System Clock DCM function test failed.
3407 FPGA1 DAC Clock DCM function test failed.
3408 FPGA1 ADC Clock DCM function test failed.
3409 FPGA1 Memory Clock DCM function test failed.
3410 FPGA2 System Clock DCM function test failed.
3411 FPGA2 DAC Clock DCM function test failed.
3412 FPGA2 ADC Clock DCM function test failed.
3413 FPGA2 Memory Clock DCM function test failed.
3414 FPGA1, 2 communication I/F test failed.
3415 CONVEND interrupt function test failed.
3416 10 MHz clock test failed.
3417 FPGA SYNC SEL pin control function test failed.
3418 FPGA SYNC FB pin control function test failed.
3419 FPGA SYNC IN pin control function test failed.
3420 IDELAY function test failed.
3421 Channel 1 SDRAM access function test failed.
3422 Channel 2 SDRAM access function test failed.
3423 WGFMU EEPROM access function test failed.
3424 Channel 1 RSU EEPROM access function test failed.
3425 Channel 2 RSU EEPROM access function test failed.