User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 9-67
If You Have a Problem
Error Codes
2400 SPGU module is in TEST FAIL state.
2401 Digital H/W function test failed.
2402 CPLD access function test failed.
2403 CPLD version check test failed.
2404 CPLD revision check test failed.
2405 FPGA configuration test failed.
2406 FPGA access function test failed.
2407 FPGA version check test failed.
2408 FPGA revision check test failed.
2409 DCM function test failed.
2410 CONVEND interrupt function test failed.
2411 EMG interrupt function test failed.
2412 10 MHz clock test failed.
2413 FPGA SYNC SEL pin control function test failed.
2414 FPGA SYNC FB pin control function test failed.
2415 FPGA SYNC IN pin control function test failed.
2416 IDELAY function test failed.
2417 NVRAM access function test failed.
2418 ADC function test failed.
2419 SDRAM access function test failed.
2430 Module EEPROM CRC data is invalid.
2431 Module EEPROM CRC data of module data ID is invalid.
2432 Module EEPROM CRC data of format revision data is invalid.
2433 Module EEPROM CRC data of analog reference data is invalid.
2434 Module EEPROM CRC data of timing calibration data is invalid.
2435 Module EEPROM CRC data is skew calibration data invalid.
2450 Internal ADC function test failed.
2451 0.5 Vref Internal ADC function test failed.