User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
9-66 Agilent B1500 User’s Guide, Edition 7
If You Have a Problem
Error Codes
Agilent B1500A Self-test/Calibration Error
When Agilent B1500 fails the self-test or self-calibration, the B1500 returns the
following error code and error message.
In the error code, N indicates the slot number. If the module is installed in slot 1, and
it fails the function
test, the error code will be 1760.
700 CPU failed NVRAM read/write test.
701 CPU failed FPGA read/write test.
702 CPU failed H-RESOLN ADC end signal test.
703 CPU failed H-RESOLN ADC start signal test.
704 CPU failed emergency status signal test.
705 CPU failed SRQ status signal test.
706 CPU failed high voltage status signal test.
707 CPU failed low voltage status signal test.
708 CPU failed DAC settling status signal test.
709 CPU failed measure ready status signal test.
710 CPU failed set ready status signal test.
711 CPU failed measure end status signal test.
712 CPU failed measure trigger signal test.
713 CPU failed pulse trigger signal test.
714 CPU failed abort trigger signal test.
715 CPU failed DAC set trigger signal test.
720 H-RESOLN ADC is not installed.
721 H-RESOLN ADC failed ROM/RAM test.
722 H-RESOLN ADC failed B-COM offset DAC test.
723 H-RESOLN ADC failed sampling ADC test.
724 H-RESOLN ADC failed integrating ADC test.
725 H-RESOLN ADC failed bus function test.
740 GNDU failed calibration.
935 CMU FPGA version mismatch.