User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
2- 6 Agilent B1500 User’s Guide, Edition 7
Introduction
Overview
The EasyEXPERT has the following measurement execution environments.
• Application test
• Classic test
•Quick test
Application Test The EasyEXPERT contains an application lib
rary that supports typical
measurements for CMOS devices, TFT, BJT, memory, nanotechnology devices such
as CNT FET, and so on. The application library includes more than two hundred test
definitions.
You can perform measurements by choosing the best one for your device under test
(DUT) from the application libraries
, and modifying and executing it. Modification
is really simple. For example, it will be completed by changing the output voltage
only to DUT terminals. And the setup with your modifications can be saved and
recalled as your setup (My Favorite Setup).
Classic Test You can perform measurements by using
the user interface s
imilar to the
semiconductor parameter analyzers such as Agilent 4156C. The setup can be made
by entering values into the setup tables used for the measurement module control.
And it can be saved and recalled as your setup (My Favorite Setup). This
measurement environment provides the following functions.
• I/V Sweep
• Multi Channel I/V Sweep
•I/V List Sweep
• I/V-t Sampling
• C-V Sweep
• SPGU Control
• Switching Matrix Control
• Direct Control
The Direct Control test mode is used to control the measurement modules directly
b
y using
the B1500A GPIB control commands and perform measurement. For the
control commands, see “Agilent B1500A Programming Guide”.
Quick Test You can execute the test setups saved in a preset group (My Fa
vorite Set
up)
sequentially.