User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

9-62 Agilent B1500 User’s Guide, Edition 7
If You Have a Problem
Error Codes
Set the appropriate pattern data to ALW. The output level value in the
pattern data must be 0 to ± 40 V in 1 mV resolution.
2204 Load vo
ltage is too small for DUT impedance measurement.
Failed to perform the terminal voltage measurement and the load
impedance calculatio
n by the CORRSER? command. Set the SPGU
output voltage more than 1 V. Set high voltage for high impedance.
2206 Auto correction of load impedance failed.
Cannot perform the SPGU automatic level adjustment. Load
impedance exceeds the acceptable ran
ge. Change the SPGU output
voltage or the DUT.
3000 WGFMU module does not exist.
Check the channel number of the WGFMU module and s
et the correct
value.
3001 RSU is not connected.
Check the channel number of the WGFMU module connected
to the
RSU and set the correct value.
3015 Measurement data corrupted.
Cannot get the measurement data. Correct measurement result is not
stored in the
memory.
3050 Measurement data memory overflow error.
ALWG sequencer run time error. WGFMU module memory overflow
occurred. Data exceeds memor
y size could not be stored.
3051 Measurement data FIFO overflow error.
ALWG sequencer run time error. WGFMU module FIFO overflow
occurred because
the averaging count was frequently changed.
3052 Measurement range change request error.
ALWG sequencer run time error. Measurement range cannot be
changed because th
e range change interval is too short.
3201 ALWG Sequence Data is not ready.
Sequence data must be set to the specified WGFMU channel.
3202 ALWG Waveform Data is not ready.
Waveform data must be set to the specified WGFMU channel.