User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 9-61
If You Have a Problem
Error Codes
Set the appropriate value to CORRSER?. The period value must be
more than delay+interval×count value.
2132 Sp
ecified delay for DUT impedance measurement out of abso
lute
limits.
Set the appropriate delay time valu
e to CORRSER?.
2133 Specified interval for DUT impedance measurement out of abs
olute
limits.
Set the appropriate interval valu
e to CORRSER?.
2134 Specified count for DUT impedance measurement out of
absolute
limits.
Set the appropriate count value to
CORRSER?.
2151 ALWG Sequence Data is not ready.
Sequence data must be set by using ALS before starting the output.
2152 Specified ALWG Sequence Data size is out of absolute limits.
Set the appropriate sequence data to ALS. Too large data was specified.
2153 Specified pattern index of ALWG Sequence Data is out of absolute
lim
its.
Set the appropriate s
equence data to ALS. The pattern ind
ex in the
sequence data must be the index of a pattern defined in the pattern data.
2154 Specified repeat count of ALWG Sequence Data is out of absolute
limits.
Set the appropriate s
equence data to ALS. The repeat count in the
sequ
ence data must be 1 to 1048576.
2155 ALWG Pattern Data is not ready.
Pattern data must be set by using ALW before starting the output.
2156 Specified ALWG Pattern Data size is out of absolute limits.
Set the appropriate pattern data to ALW. Too large data was specified.
2157 Specified interval time of ALWG Pattern is out of absolute limits.
Set the appropriate pattern data to ALW. The incremental time value in
t
he patte
rn data must be 10 ns to 671.088630 ms in 10 ns resolution.
2158 Specified output voltage of ALWG Pattern Data is out of absolute
limits.