User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 9-37
If You Have a Problem
Error Codes
114104 Folder creation failed during automatic data export. Specify the correct
drive letter and folder path in the Test Results Data Auto Export dialog
box.
114105 Change the file extension in the Test Results Data Auto Export dialog
box. Specified va
lue contains an invalid character.
Specified file extension: A
114106 Data file creation failed during automatic data export. Refer to the
detail mes
sage, and retry after taking necessary measures.
114107 Index file creation failed during automatic data export. Refer to the
detail mes
sage, and retry after taking necessary measures.
114151 Specify the XML Style Sheet File Path in the Test Results Data Auto
Export dialog box
.
114152 Change the XML Style Sheet File Path in the Test Results Data Auto
Export dialog box
. Specified value contains an invalid character.
Specified path: A
115001 There is no working test setup. First preset the test setup.
115011 The application test A depends on an u
ndefined application test B.
Import the application test B in advance.
115021 Test setup import operation failed. Probably the imported contents are
not a test se
tup.
115022 Test setup conversion failed. Setup A is not available for the
tests that
use the model B.
115031 Failed to invoke A.
115032 Repeat execution was aborted.
115041 Standby state was changed to OFF due to high voltage related error.
116001 Connected model not supported by Desktop EasyEXPERT. Only model
A is supported. Connected model: B (ad
dress: C)
11
6002 B1500 firmware revision A is not supp
orted by Desktop EasyEXPERT.
Only revisions B and later are supported.
116003 Invalid argument specified for /gpib. Specified argument: /gpib:A
Example argument (valid
): /gpib:gpib0::17
116004 Desktop EasyEXPERT does not support 4155/56 firmware revision A.
Update the firm
ware to the revision B or later.