User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 2- 3
Introduction
Overview
Overview
Agilent B1500A Semiconductor Device Analyzer is the new generation one box
solution for the semiconductor device DC/AC parametric measurement and analysis
application. You can perform measurement and analysis easily and effectively on
the Microsoft Windows environment with intuitive graphical user interface, touch
screen LCD panel, keyboard, and mouse by using Agilent B1500A.
Agilent B1500A provides the DC voltage/current output capability, the DC
voltage/
current measurement capability, and the AC signal output and impedance
measurement capability. So you can perform the current-voltage sweep
measurement and the capacitance-voltage sweep measurement for example by one
instrument. You can also analyze the measurement result characteristics graph by
using several tools such as markers, cursors, and lines.
Also, in the GPIB remote control mode, you can control the B1500A from an
ex
ternal com
puter by using Agilent FLEX command set that is the common
language for Agilent semiconductor DC measurement instruments. So you can reuse
the measurement program created for Agilent 4155/4156/E5260/E5270.