User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
9-6 Agilent B1500 User’s Guide, Edition 7
If You Have a Problem
When You Perform Measurement
When You Perform Measurement
This section covers the following basic problems that you may encounter when you
making a measurement, and the solutions.
• “Measurement Takes More Time than Specified”
• “Noise Affects the Measured Values”
• “Voltage Measurement Error is Large”
• “SMU Oscillates for High-Frequency Device Measurements”
• “SMU Oscillates for Negative Resistance Measurements”
• “Large Current Causes High Temperature (Thermal Drift)”
• “Measurement Damages the Device under Test”
• “Leaving Connections Damages Devices after Measurement”
• “Unexpected Sampling Measurement Data is Returned”
• “MFCMU Causes Unbalance Condition”
Measurement Takes More Time than Specified
If you set many measurement channels, auto ranging mode, or too long integration
time, measurement takes a longer time.
To solve this problem:
Depending on your measurement requirements, perform following:
• Decreases measurement channels.
• Uses limited auto ranging mode.
• Uses fixed range.
• Decreases averaging samples of the high-speed A/D converter.
• Decreases integration time of the high-resolution A/D converter.
• Disables the ADC zero function.