User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 8- 23
Built-in Programming Tool
Script Program Statements
(continues from the previous page)
VthInitial = getNumericData("VthBefore")
VgateList = getVectorData("Vgate")
IdInitialList = getVectorData("Idrain")
!***** Force Pulse *****
ForcePG1
ResetPG
!***** I/V Sweep & Analysis after Write *****
ForcePG2
Id-Vg_Written
ResetPG
Auto Analysis
VthWritten = getNumericData("VthAfter")
IdWrittenList = getVectorData("Idrain")
END BLOCK
Lines 19 to 21: Enters the value of the variables (VthBefore, Vgate, Idrain) defined
in the Function Setup or Display Setup of the Id-Vg_Initial test into the local
variables (VthInitial, VgateList, IdInitialList). The ASSIGN statements are used.
Line 22: Comment line. The COMMENT statement is used.
Line 23: Executes ForcePG1 of the Application Test com
ponent to perform the
NAND-type flash memory write operation.
Line 24: Executes ResetPG of the Application Test component.
Line 25: Comment line. The COMMENT statement is used.
Line 26: Executes ForcePG2 of the
A
p
plication T
e
s
t component.
Line 27: Executes Id-Vg_Written of the Application Test component to perform
Id-Vg measuremen
t.
Line 28: Executes ResetPG of the Application Test component.
Line 29: Executes Auto Analysis of the Analys
is component.
Lines 30 to 31: Enters the value of the variables (VthAfter, Idrain) defined in the
Functio
n Setup or Display Setup of the Id-Vg_Written test into the local variables
(VthWritten, IdWrittenList). The ASSIGN statements are used.
Line 32: End of program