User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 8- 3
Built-in Programming Tool
Variables and Expressions
Variables and Expressions
Variables can be used in Agilent EasyEXPERT setup editor for the following
applications. User functions and analysis functions can also be used for variables.
• To store the value of the measurement condition input parameter
• To store the value of the measurement result data or analysis data
• Variable used in the test execution flow of the Application Test definition
• User function of the Classic Test definition
• Analysis function of the Classic Test definition
The following characters can be used for the variable name.
• Alphabetic characters A to Z and a to z, case sensitive
• _ (underscore)
• Numeric characters 0 to 9
• @ (at mark)
Numeric characters and at mark cannot be used
for the first character of
variable
name.
NOTE About variable names
The variable name must be unique. If a variable is defined as a local variable in an
application test definition and its name is the same as one of the following variables,
the local variable is effective and the following variable is not effective.
• variable that defines a built-in function in a test setup
• variable that defines a read out function in a test setup
• variable defined as a test parameter
• variable defined as a device parameter
• variable defined as an analysis parameter
The local variables are defined by using the L
ocal Variable
Definition statement in
the Test Contents setup displayed on the Test Definition window. The test
parameters and the device parameters are defined in the Test Specification setup,
and the analysis parameters are defined in the Test Output setup.