User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
7- 60 Agilent B1500 User’s Guide, Edition 7
Function Details
SMU Measurement Time
Wait Time
Wait time is the time after starting source output until changing the source output
value or until starting measurement. You can set the source wait time and the
measurement wait time individually.
The source wait time is the time the source channel always waits after it starts output
until it
changes the output value. The measurement wait time is the time the
measurement channel always waits after the source channel starts output until the
measurement channel starts measurement. Refer to Figure 7-27. The wait time is
given by the following formula:
wait time = N × referenc
e
where reference is the wait
time Agilent B1500 automatically sets according to the
present settings; this wait time cannot change. Available N values are 0 to 10, 0.1
step. Initial value is 1.
It is not easy to determine the best wait time. If you specify it too short, the
measurement m
ay start before device characteristics stable. If too long, time will be
wasted. For measurements of low capacitance or fast response devices, if
measurement speed has top priority or is more important than reliability and
accuracy, set the wait time shorter. The initial wait time may be too short for
measurements of high capacitance or slow response devices. Then set the wait time
longer.
Figure 7-27 Source/Measurement Wait Time
NOTE In the GPIB remote mode, if the delay time is longer than the wait time, the wait
time can be ignored.
The EasyEXPERT does not support the step delay time.
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