User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 7- 57
Function Details
SMU Measurement Time
SMU Measurement Time
Measurement time depends on integration time, measurement range, and other
measurement conditions, and can be expressed by the following formula:
Measurement time = Integration
time + Overhead time
Integration time is the time required for measurement, and does n
ot include such
factors as range changing or data compensation, which would be the overhead time.
Integration Time
Integration time is the time required to get measurement data. For accurate and
reliable measurement, integration time should be increased. Integration time can be
set for each type of A/D converter (ADC) used by the measurement channel.
• High-speed ADC
You can adjust the number of averaging samples instead
of the integration time.
For high speed measurement. Installed in each measurement module.
• High-resolution ADC
You can adjust the integration time directly. For high accuracy and high
resolution measurement. This ADC is mounted on the mainframe, and used by
the multiple modules alternately.
To set the integration time or the number of averaging samples, select the mode and
set the valu
e as shown in Table 7-8.
ADC Zero
Fun
ction
The ADC
zero function is available for the high-resolution A/D converter (ADC)
and not available for the high-speed ADC. This function measures the internal offset
of the high-resolution ADC and compensates it automatically. The measurement
data displayed on the LCD will be the data after compensation.
NOTE This function is especially effective for the low voltage measurement. Disable the
function in cases where measurement speed is more important than measurement
accuracy. This approximately halves integration time.