User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
7- 40 Agilent B1500 User’s Guide, Edition 7
Function Details
Bias Hold Function
Bias Hold Function
This function is used to keep source output after measurement. Source modules
apply the specified bias between measurements in a quick test or application test
that defines some classic test setups, or a repeat measurement. And the source
modules change the output value and the unused modules are disconnected when the
next measurement is started.
Output channels
a
nd output value
If th
e bias hold function is OFF, the channel stops the output immediately after
measurement.
If the function is ON, the channel continues the output as shown below.
I/V Sweep measurement:.
• VAR1 and VAR1’ output channels: Sweep start or stop value
• VAR2 output channel: Sweep stop value
• CONST output channels: Output value
• SMU pulse output channels: Base value
C-V Sweep measurement:
• Bias sweep output channel: Sweep start or stop value
• CONST output channels: Output value
I/V-t Sampling measurement:
• Constant source output channels: Base or source value
SPGU output:
• SPGU keeps the output as shown in Table 7-6.
Period of bias hold • From the end of a measurement to t
he end of a si
ngle measurement
• From the end of a measurement to the start of the next measurement during a
quick test, appl
ication test, or repeat measurement
Reset of source
out
put
The sour
ce output is reset after a quick test, application test, repeat measurement, or
single measurement. The SMU is set to 0 V output and 0.1 mA compliance. The
MFCMU is set to 0 V DC bias and 0 V oscillator level.