User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 7- 25
Function Details
C-V Sweep Measurement
The MFCMU will internally perform the error correction for the CMU cables and
CMU accessories that keep the four-terminal pair configuration.
For the measurements for evaluating DUT against a working s
tandard, perform the
open/short/load correction.
However, you have to consider that some parasitic remain in measurement path
even after perfo
rming corrections. To minimize the influence of parasitic, make the
signal path from the shield ends to the DUT as short as possible.
To perform the phase compensation and error correction, see “CMU Calibration” on
page 4-37.
Figure 7-14 Error Correction
KLJK
&08UHWXUQ
ORZ
9LUWXDOJURXQG
0XOWLIUHTXHQF\&08
9
+FXU
$
/FXU
/SRW
$XWREDODQFHEULGJH
6\VWHPJURXQG
9[
2XWHUVKLHOG
LQWHUQDO
H[WHUQDO2SHQ6KRUW/RDG
9[
'87
WHUPLQDOSDLUV
WHUPLQDO
(UURUFRUUHFWLRQ
&RQQHFWLRQ
(UURUHOHPHQWV
+SRW