User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

7- 24 Agilent B1500 User’s Guide, Edition 7
Function Details
C-V Sweep Measurement
To realize accurate measurements using the four-terminal pair measurement
method, the following connection tips are important. See Figure 7-13 and Figure
7-14.
• The signal path from MFCMU to DUT must be as short as possible.
• The four-terminal pair configuration must be extended as close as possible to the
DUT.
• The out
er shield conductors must be connected toget
her at the extended cable
ends. Then take care of contacts. They must be electrically isolated.
This is the same as connecting the CMU return terminals
of the atto sense/switch
unit (ASU) or the guard switch unit (GSWU).
• The signal path from the shield ends to the DUT must be as short as possible.
• If it is possible, make protective guard (plate, shield, or anything) around the
DUT, and con
nect it to the outer shield conductor of the four-terminal pair
configuration. This minimizes the effects of stray capacitance and electrical
noise. Then take care of contacts. The guard must be electrically isolated.
• The Low (Lcur, Lpot) terminal must be prevented from st
ray capacitance and
guard capacitance. If the measurement terminal has to be connected to the wafer
chuck, use the High (Hcur, Hpot) terminal to connect to the wafer chuck.
Error Correction
The MFCMU is equipped with the error correction function used to realize accurate
impedance measurements. The correction function minimizes the effects of the error
elements in the extension cables and the DUT interface such as manipulator and
probe card.
• Phase compensation
Corrects phase error caused by extending measurement cables.
• Open correction
Corrects for stray admittance. Effective for high impedance measurements.
• Short correction
Corrects for residual impedance. Effectiv
e for low im
pedance measurements.
• Load correction
Corrects any error by using the working standard.