User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 7- 23
Function Details
C-V Sweep Measurement
Four-Terminal Pair Configuration
Generally, any mutual inductance, interference of the measurement signals, and
unwanted residual factors in the connection method incidental to ordinary
termination methods will have significant effects on the measurements, especially at
a high frequency. The MFCMU employs the four-terminal pair (4TP) measurement
configuration which permits easy, stable, and accurate measurements and avoids the
measurement limitations inherent to such factors.
Figure 7-13 shows the four-terminal pair meas
urement principle. Th
e measurement
terminals consist of the following four coaxial connectors.
• Hcur: High current
• Hpot: High potential
• Lpot: Low potential
• Lcur: Low current
Figure 7-13 Four-Terminal Pair Measurement Princip
le
The four-terminal pair measurement method has the advantage in both low and high
impedance measur
ements. The outer shield conductors work as the return path for
the measurement signal current (they are not grounded). The same current flows
through both the center conductors and outer shield conductors (in opposite
directions), but no external magnetic fields are generated around the conductors (the
magnetic fields produced by the inner and outer current completely cancel each
other). Because the measurement signal current does not develop an inductive
magnetic field, test leads do not contribute additional errors due to self or mutual
inductance between the individual leads.
'87
0XOWLIUHTXHQF\&08
9
+FXU
+SRW
$
/FXU
/SRW
$XWREDODQFHEULGJH
9LUWXDOJURXQG
6\VWHPJURXQG
,[
,[
9[
9[
,[
,[
2XWHUVKLHOGRU*XDUG