User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

7- 22 Agilent B1500 User’s Guide, Edition 7
Function Details
C-V Sweep Measurement
Figure 7-11 Impedance and Parameter Calculation
In the GPIB remote mode, you can get the inductance data. For your reference,
select the parallel
measurement mode (Lp-G, Lp-D, or anything) for the high
inductance measurements (100 Ω or more of impedance), and select the series
measurement mode (Ls-Rs, or anything) for the low inductance measurements
(100 Ω or
less of impedance). Because the reactance of hig
h inductance at a given
frequency is relatively high (compared with that of a low inductance), so the parallel
resistance becomes more significant than the series component.
Figure 7-12 Admittance and Parameter Calculation
In some case, the reciprocal of impedance (admittance) Y is used. Figure 7-12
shows the vector representation of admittance. As impedance Z, Y contains a real
an
d an imaginary part, and
is expressed in rectangular form as conductance G and
susceptance B, or in polar form as magnitude of admittance |Y| and phase φ.
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