User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 7- 21
Function Details
C-V Sweep Measurement
Measurement Parameters
MFCMU performs impedance measurement, calculates parameters shown in Table
7-2, and returns the calculated data. A combination can be selected for t
he return
data. For your reference, select the parallel measurement mode (Cp-G or Cp-D) for
the low capacitance measur
ements (100 Ω or more of impedance), and select the
series measurement mode (Cs-Rs) for the high capacitance measurements (100 Ω or
less of impedance). Because the low capacitance yields high reactance, which
implies that the effect of the parallel resistance has relatively more significance than
that of series resistance.
Table 7-2 Measurement Parameters
NOTE GPIB remote mode
In the remote mode, the MFCMU can calculate and return the other measurement
parameters. See Table 2-13 and Programming Guide. In Agilent EasyEXPERT
operation environment, only the parameters shown in Table 7-2 are available.
About Impedance Measurements
All circuit components, resistors, capacitors, or inductors, have parasitic
components, for example unwanted resistance in capacitors, unwanted resistance in
inductors, and unwanted inductance in resistors. Thus simple components should be
modeled as complex impedances.
Impedance definitions and vector representation of impedance are shown in Figure
7-11. Impedance Z is the total opposition that a circuit or device offers to the flow of
alternating current at a given frequency. Z con
tains
a real and an imaginary part, and
it is expressed in rectangular form as resistance R and reactance X, or in polar form
as magnitude of impedance |Z| and phase θ.
In addition to these parameters, the quality factor Q and dis
sipation factor D are
used to describe the quality of components.
Primary Parameter Secondary Parameter
Cp (parallel capacitance, F) G (conductance, S)
Cp (parallel capacitance, F) D (dissipation factor)
Cs (series capacitance, F) Rs (series resistance, Ω)
Z (impedance, Ω) θ (phase, degree)