User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 7- 17
Function Details
I/V-t Sampling Measurement
Time Data and Index
To obtain the time data, enter a variable name (e.g. Time) into the Time Stamp
Name field of the Channel Setup screen. The time data can be obtained after the
linear sampling measurement is executed, and can be expressed by the following
formula.
Time = Hold Time + Interval × [(Index − 1) + N]
+ α
Time : Variable name set to the Time Stamp Name field of the Measurement
Setup screen.
Time data is returned.
Index : Variable name set to the Index Name field of the Measurement Setup
screen. Dat
a index is returned. Maximum value is 2147483647.
Interval : Sampling interval. Defined in the Measurement Setup screen.
Hold Time : Hold time. Defined in the Measurement S
etup screen.
N : Number of samplings performed while one point measuremen
t was
executed. This value is 0 if the sampling interval is longer than the
measurement time.
α : Time from the start of one point measurement to the start of
integration b
y the A/D converter.
If the sampling interval is longer than the actual measurement time, meas
urement
channels repeat measurement with the specified sampling interval. However, if the
sampling interval is shorter than the measurement time, the measurement interval
will be integral multiples of the specified sampling interval. Example for Hold Time
=10 ms, Interval=5 ms, and the following Time values is shown in Figure 7-10. In
this case, N=3.
• Time (for Index=1) = 10 ms = 10 + 5 × [(
1 − 1) + 0] ms
•
Time (for Index=2) = 30 ms = 10 + 5 × [(2 − 1) + 3] ms
Fi
gure 7-10 Sampling and Measurement Timing
%DVHKROGWLPH
DQG+ROGWLPH
,QWHUYDO
0HDVXUHPHQWWLPH
7LPH
7LPHDW,QGH[
7LPHDW,QGH[
D
E
DE7LPHIURPWKHVWDUWRIPHDVXUHPHQWWRWKHVWDUWRILQWHJUDWLRQ