User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

7- 16 Agilent B1500 User’s Guide, Edition 7
Function Details
I/V-t Sampling Measurement
Interval ≥ 0.0001 + 0.00002 × (number of measurement
channels-1)
No of Samples Number of samples. Integer. 1 to the following value.
For linear: 100001 / (number of measurement channels)
For logarithmic: 1 + (number of data for 11 decades)
Total Sampling
Ti
me This f
ield just displays the total sampling time that is the
time from
the measurement start time for the first point to
the end of sampling measurement. It does not include the
hold time.
Total Sampling Time = Interval × No
of Samples
Output
Sequence Source output sequence. SIMULTANEOUS or
SEQUENTIAL. See “Source Output Sequence and Time
Origin” on page 7-18.
Hold Time Time since the Source value out
put until the first sampling
point, in seconds. 0 to 655.35 s, resolution 0.01 s.
The following values are also available for Interval < 0.002
s. |Hold
Time| will be the time since the sampling start until
the Source value output.
-0.09 to -0.0001 s, resolution 0.0001 s.
Base Ho
ld
Time Hold tim
e of the Base value ou
tput until the Source value
output, in seconds. 0 to 655.35 s, resolution 0.01 s.
3. Specify the following parameters for the SMU in the Constants area on the
Measurement Setup screen.
Ba
se, Source Base or So
urce value, in V or A.
Base value is available for all output channels for the
SIMULTANEOUS mode and the
last source channel for the
SEQUENTIAL mode.
Compliance Compliance value, in A or V.
Value effective for Base, Source, and Compliance:
0 to ±0.1 A (HRSMU/MPSMU) or ±1 A (HPSMU)
0 to ±100 V (HRSMU/MPSMU) or ±200 V (HPSMU)