User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 7- 15
Function Details
I/V-t Sampling Measurement
Setup Parameters
The following setup is required to perform the I/V-t sampling measurements. See
“I/V-t Sampling” on page 5-21 for the GUI.
NOTE If you set Interval < 0.002 s
Sampling mode must be linear. This setting is not permitted for the log sampling.
Also SPGU is not available.
All measurement channels must use the high speed A/D con
verter (ADC). This
setting is not permitted if a measurement channel uses the high resolution ADC.
If the multiple measurement channels are used, all channe
ls perform measurement
in parallel.
If the measurement ranging mode is not the fixed mode, the meas
urement channels
automatically select the minimum range that covers compliance value set to the
channel.
If the measurement time is expected to be longer t
han Interval, the measurement
channels automatically adjust the number of averaging samples (ADC settings) to
keep the sampling interval.
1. Select the following on the Channel Setup screen.
• Select SMUs used for constant voltage sources or constant current sources.
• Select V or COMMON for Mode of current monitor SMU, or I for voltage
monitor SM
U.
2. Specify the following parameters for the SMU in the Sampling Parameter area
on the Measurement Setup s
creen.
Linear/Log Sampling mode. LINEAR for linear sampling. LOG10,
LOG25, LOG50,
LOG100, LOG250, or LOG500 for
logarithmic sampling.
For the logarithmic sampling, the number after LOG
indicates the num
ber of measurement data in a decade. For
example, LOG10 mode is used to get 10 data/decade.
Interval Interval of the sampling, in seconds. 0.002 to 65.535 s,
0.001 s reso
lution.
Interval < 0.002 s in 0.00001 s resolution is also available
for the li
near sampling. It must satisfy the following
formula. See NOTE above.