User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
7- 14 Agilent B1500 User’s Guide, Edition 7
Function Details
I/V-t Sampling Measurement
1. When the Output Sequence is SEQUENTIAL, source channels start the Source
value output in order, and the last source channel starts the Base value output
(Starts sampling). See “Source Output Sequence and Time Origin” on page
7-18.
When the Output Sequence is SIMULTANEOUS, source chann
els start the Base
value output simultaneously (Starts sampling).
Base value is available for all output channels for the SIMULTANEOUS mode
and the las
t source channel for the SEQUENTIAL mode.
2. Base Hold Time later, th
e source channels change the output to the Source value.
The channels keep the value until the end of the sampling measurement.
3. Another Hold Time
later, the measurement channel starts measurement for the
first sampling point. If multiple channels are used, the channels perform
measurement in order. See “Multiple Measurement Channels” on page 7-61.
4. After that, the following operation is repeated with the specified time Interval.
This op
eration is repeated until the number of measurement result data reaches
the specified No
of Samples of measurement data.
• Measurement channels start measurement if they
are ready to measure.
• Measurement channels keep the condition if they
are busy.
For the log sampling, the B1500A holds only the data that can be plotted on the
log scale i
n the same distance as close as possible. Only the held data is counted
in the number of measurement result data.
For the linear sampling with Interval
< 2 ms, if the total measurement time runs
over the specified time Interval × No of Samples, the sampli
ng measurement will
be stopped even if the number of measurement result data is less than the
specified No of Samples.
5. The source channels stop the output, and the I/V-t sampling measurement is
completed.
If
the bias hold function is enabled, the source channe
ls force the Base or Source
value.
NOTE Time data and index
For the log sampling, the recorded data will be only the data that can be plotted on
the log scale in the same distance as close as possible. The index of the first data is
1. And the index of the following data will increase by 1. For the linear sampling,
see “Time Data and Index” on page 7-17.