User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

7- 12 Agilent B1500 User’s Guide, Edition 7
Function Details
Multi Channel I/V Sweep Measurement
Multi Channel I/V Sweep Measurement
Multi Channel I/V Sweep measurement is similar to I/V Sweep measurement.
Changes from I/V Sweep are listed below.
• All SMU can be set to the VAR1 sweep source (up to 10 channels)
• Both voltage mode and current mode are available for the VAR1 sweep output
• VAR1’ sweep output is not available
• SMU pulse output is not available
The timing of the sweep output and measurem
ents are shown in Figur
e 7-8. The
output channels start to output in the order in which they are listed on the Channel
Setup screen. If
multiple measurement channels are used, the channels perform the
measurements in order. See “Multiple Measurement Channels” on page 7-61.
Figure 7-8 Multi Channel I/V Sweep Measuremen
ts using High-Resolu
tion A/D Converter
Start measurement
Voltage or current
Stop value
Start value
0
Time
:Measurement
Hold time
Delay time
Stop value
Start value
0
Voltage or current
Stop value
Start value
0
Voltage or current
Primary sweep source
Second sweep source
Tenth sweep source
Delay time