User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
7- 10 Agilent B1500 User’s Guide, Edition 7
Function Details
I/V Sweep Measurement
Period SMU forces the next pulse after specified pulse period.
5 ms to 5 s with 100 μs resolution.
Width Time from when SMU output starts to change from base
value to
time when SMU starts to return from peak value.
Measurements are made while the peak value is output.
0.5 ms to 2 s with 100 μs resolution.
Base The base output value of the SMU pulse.
Pulse peak value Pulse peak value depends on the Function setting of the pulse source SMU. See
Table 7-1.
Table 7-1 Pulse Peak and Function
Measurement
ch
annel
Only one S
MU can be used for the measurement channel.
The measurement channel always uses the compliance range which cov
ers the
setting compliance value. The Range button in the Measurement Setup is not
available.
The measurement integration time cannot be changed. The ADC/Int
eg button in the
Measurement Setup is not available.
Function Pulse peak
CONST Source value in the Constants area
VA R1 Calculated from the Start, Stop, Step values of the VAR1.
VA R2 Calculated from the Start, Stop, No o
f Step values
of the
VA R2 .
VA R1 ’ Calculated from the Start, Stop, Step values of the VAR1
and the Offset an
d Ratio values of the VAR1’.