User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 6- 43
Application Test Definition
Using Command Execution
NOTE string built-in function
The string built-in function is used to translate a numeric expression to a string
value. Be careful about the argument for this function. If it is a numeric variable
defined with the numeric-symbol assignment, the string function execution result
will be the symbol assigned to the numeric value, not the string value just translated
from the numeric value. The numeric-symbol assignment is defined in the “Test
Specification” on page 6-5.
For the following example setup of the numeric-symbol assignment,
string(Mode) ex
ecution result at Mo
de=0 is the string OFF, not the string 0.
Parameter Mode, Value=0, Symbol=OFF
Defining Numeric/Vector Input Parameter
1. Define a vector variable in the Test Specification tab screen or the Local
Variable Definition component of the Test Contents tab screen.
2. Set the Write Type to List in the Windows Command Execution component.
3. Enter the variable name in the Values field of the Write List area.
For the numeric parameter, a data element of vecto
r variable is
used to store the
data for the parameter. Specify the data by using the Format field. For example,
enter {0} to specify the data in the first element of the vector variable. For the
Format field, see “Defining Format Field” on page 6-45.
For the vector parameter, ignore the Format field.
Defining String/Numeric Input Parameters
1. Define string or numeric variables in the Test Specification tab screen or the
Local Variable Definition component in the Test Contents tab screen.
2. Set the Write Type to String in the Windows Command Execution component.
3. Add a line in the Write String area.
4. Enter the variable name for the first input parameter in the first line.
If the command needs multiple input parameters, add a line and enter the
v
ariable name for
the variable in the added line. Then observe the order of
parameters.
To enter a numeric variable name, use the string bui
lt-in function. For example,
enter string(Rz) to set the Rz numeric variable.