User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 6- 23
Application Test Definition
Test Contents
External Variable Setup
This dialog box is displayed by clicking the Assign to external variable... button on
an Application Test setup screen or a Classic Test setup screen, and is used to make
a mapping table between the test setup internal variables and the local variables,
device parameters, test parameters, or analysis parameters defined in the test
definition which uses this test setup. After making the mapping table, you can read
the value by using the external variables.
This dialog box provides the following buttons.
Add Adds the variable entry fields.
Delete Deletes the variable entry fields selected by the radio button.
Up Shifts the selected variable entry fields upward.
Down Shifts the selected variable entry fields downward.
This dialog box provides the following entry fields.
External variable Name of local variable, device parameter, test parameter, or analysis parameter
connected with the variable s
et to the Measurement data field
Measurement data Name of internal variable used in a test setup and to be read. For the Application
T
est, only the an
alysis parameters are available.
Example The following example connects the internal vecto
r variable Vdata with the
local
variable VDATA.
1. Define VDATA as a local variable by using the Local Variables Definition
statement.
2. Click
the Assign to external variable... button on a test setup screen.
3. Click the Add button on the External Variable Setup dialog box.
4. Set VDATA to the External variable field.
5. Set Vdata to the Measurement data field.
6. Click the Close button.