User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
6- 22 Agilent B1500 User’s Guide, Edition 7
Application Test Definition
Test Contents
Variable Inspector
This Variable Inspector is displayed by clicking the “Inspect (page 6-21)” button on
the Test Contents screen, and is used to monitor o
r change the value of the local
variables, device parameters, test parameters, and analysis parameters. For the
vector variables, only data monitor is available. The Variable Inspector provides the
following buttons to add the variable monitor area.
Add Numeric Variable Adds the numeric variable monitor area.
Add Vector Variable Adds the vector variable monitor area.
Add String Variable Adds the string variable monitor area.
Add Module Variable Adds the module variable monitor area.
The following functions are available for the menu displayed by clicking the banner
o
f the variable monitor
area.
Up This button shifts the variable monitor area upward.
Down This button shifts the variable monitor area downward.
Remove This button deletes the variable monitor area.
Numeric Variable You can monitor or change the following information.
Variable Numeric variable name
Value Value of the variable
Vector Variable You can monitor the following information.
Name Vector variable name. Two dimensional array.
Index1/2 Index for the primary/secondary plane
of the two
-dimensional array
Value Value of the variable
String Variable You can monitor or change the following information.
Variable String variable name
Value Value of the variable
Module Variable You can monitor or change the following information.
Variable Module variable name
Value Value of the variable