User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 6- 21
Application Test Definition
Test Contents
Debugging Test Contents
On the Test Contents tab screen, click the Debug tab. The following buttons will
appear. They are useful for debug of your test contents.
Set the break point, and click the Run button. And check the operation of th
e test
contents, the value of variables by using the Variable Inspector, and so on.
Figure 6-6 Debugging Test Contents
Run/Pause This button starts the debug (executes the test flow). During execution, the label
ch
anges to Paus
e. Clicking Pause pauses the execution, and changes the label to Run
that is used to continue the debug (execution).
Abort This button aborts the debug (execution).
Step This button executes the selected line of the test flow. Clicking the button repeatedly
co
ntinues the execution by a line.
Bre
ak This button sets/releases the break point. For
the break
point, this button releases the
break point from the selected line. Program execution will break at the break point
automatically.
Inspect This button is available when the debug (execution) is paused or broken. This button
o
pens the Variable In
spector used to monitor value of device parameters, test
parameters, analysis parameters, local variables, or system variables. See “Variable
Inspector” on page 6-22.
%UHDNSRLQW
3DXVHGSRLQW