User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 6- 19
Application Test Definition
Test Contents
Miscellaneous This component selection menu lists the miscellaneous functions available for the
test flow, and provides the following components.
• “GPIB I/O” on page 6-33
• “Message” on page 6-38
• “Command Execution” on page 6-40
• “Data Store Control” on page 6-39
To add a component to the test flow, select th
e destination
line for the component
and drag the component from the component selection area to the test flow list area.
Instead, you can select a line and a component, then click the Insert button. The
component will be put on the line after the selected line, and the following lines will
shift downward.
After adding a component to the test flow, selecting the new line might display an
editor at the c
enter to lower right of the window. The editor is used to define the
setup. Some components provide the editor, and some components do not. For
example, the Local Variables Definition provides the editor used to define the local
variables. See “Local Variable Definition” on page 6-24.
You can edit the test flow by using the Block Selection/Line Selection, Insert,
Delete
, Copy, Cut, and Paste buttons. Also you can debug the test flow by using the
Run/Pause, Abort, Step, Break, and Inspect buttons. See “Debugging Test Contents”
on page 6-21.
Edit / Debug The Edit tab displays the buttons Block Selection/Line Selection, Insert, Delete,
C
opy, Cut,
and Paste.
The Debug tab displays the buttons Run, Abort, Step, Break, and Inspect.
Only the buttons effective for the selected line in the lis
t area are active.
Block Selection /
Line Selection
The Line
Selection button changes the list area selection mode to the line selection
mode. The Block Selection button changes the selection mode to the block
selection.
In the line selection mode, the line cursor selects every
line.
In the block selection mode, the line cursor selects every block
. For example, the
lines from the IF statement to END IF statement can be a block.