User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
6- 18 Agilent B1500 User’s Guide, Edition 7
Application Test Definition
Test Contents
Program
Component
This component selection menu lists the program components available for the test
flow. See “Program Component” on page 6-26.
Application Test This menu lists the application test setups available for the user. Inserting an
ap
plication test s
etup to the test flow displays the test setup screen almost same as
the “Application Test” on page 4-27. You set the test condition on this screen.
Variables can be used for setting the test condition. To use a Numeric or Module
variable, enter the variable n
ame to the entry field. To use a String variable, type an
equal sign (=) and enter the variable name (for example, =VAR).
Clicking the Assign to external variables... button opens the External Variable Setup
dialog box
. See “External Variable Setup” on page 6-23.
Analysis This component selection menu lists the analysis functions available for the test
flo
w, and prov
ides the following components.
• “Auto Analysis” on page 6-27
• “Display Data Setup” on page 6-31
• “Data Display Control” on page 6-30
Classic Test This component selection menu lists the classic test objects, I/V Sweep, Multi
Channel I/V Sweep
, I/V List Sweep, I/V-t Sampling, C-V Sweep, SPGU Control
Switching Matrix Control, and Direct Control.
Inserting a classic test component to the test flow displays the test setup screen
almost same as
the “I/V Sweep” on page 5-4, “Multi Channel I/V Sweep” on page
5-9, “I/V List Sweep” on page 5-13, “I/V-t Sampling” on page 5-21, “C-V Sweep”
on page 5-26, “SPGU Control” on page 5-57, “Switching Matrix Control” on page
5-55, or “Direct Control” on page 5-30. You set the test condition on the screen.
Clicking the Assign to external variables... button opens the External Variable Setup
dialog box
. See “External Variable Setup” on page 6-23.
My Favorite Setup This component selection menu is used to select the My Favorite setup inserted to
the
test flo
w. Specify the preset group, then select the setup.