User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
6- 14 Agilent B1500 User’s Guide, Edition 7
Application Test Definition
Test Output
Test Output
This setup screen is used to set the test result output (test result display and record)
that is the output of the test definition.
The test output setup is optional. If you have the following requirements, define the
analysis pa
rameters and set the display parameters.
• To send the test result data to the subsequent tests in an application test
• To make the program branching depends on the test result
• To make the calculation using the test data in the Test Contents
• To display/record the test result of this application test
To read the analysis parameters defined in
the applicatio
n test used in a test
definition, use the “External Variable Setup (page 6-23)” dialog box.
Define Own Output
Pa
rameters
Check
this check box to set the test result outputs of the test definition. While this
box is checked, the X-Y Graph, List Display, and Parameters areas are available.
The test result output will be obtained every execution of the test definition.
Allocate Data
Disp
lay for each
test
This field sets the Multi Display function to Ena
ble, Disable, or Comply with above
level.
If Enable is selected, th
e test result data of the same test setup name will be
displayed on the exclusive Data Display window and the test result data of the
different test setup name will be displayed on the new Data Display window.
If Disable is selected, the test result data will be always displayed on the singular
Data Display wind
ow even if it is the test result data of the different test setup name.
Select Comply with above level for comp
lying with the Multi Display ON/OFF
status or the setting of the application test which uses this application test internally.
Define Analysis
Pa
rameters..
.
This button opens the window. This “Analysis Parameter Definition (page 6-15)”
window is used to define the vector data and the scalar data used in the test result
output. The d
efined variable is called as the analysis parameter.
X-Y Graph,
Lis
t Display,
Param
eters
The areas
are used to set the test result output
(test resu
lt display and record) that is
the output of the test definition. See “Display Setup” on page 5-46.