User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

6- 12 Agilent B1500 User’s Guide, Edition 7
Application Test Definition
Test Specification
Tab Order menu Top to Bottom Sets the TabIndex in ascending order of the X of the entry
fields, starting at the upper left entry field. If the X of the entry
fields are equal, the TabIndex is set in ascending order of the Y
of the entry fields. For more information on X/Y, see
“Properties” on page 6-12.
Left to Right Sets the TabIndex in ascending order of the Y of the entry
fields, starting at the u
pper left entry field. If the Y of the entry
fields are equal, the TabIndex is set in ascending order of the X
of entry fields.For more information on X/Y, see “Properties”
on page 6-12.
Properties
This window is opened by clicking the Property... button in the View menu of the
Define Layout dialog box, and specifies characteristics of the entry field area or the
entry fields.
When the entry field area is selected, the followi
ng characteristics can be specified.
Design DrawGrid Sets whether to display the grid.
GridSize Sets the width and the height of the grid.
SnapToGrid Sets whether to snap to the grid.
Layout Size Sets the width and the height of the entry field area.
When entry fields are selected, following characteristics can be specified.
Behavior TabIndex Sets the tab traversing order for the test parameter entry fields
of the applicatio
n test.
Layout Align Specifies the X origin
of the entry field.
Tru
e: Left edge of the entry field
False: Left edge of the parameter name placed to the left of the
entry field
Widt
h Specifies the width of the entry field.
X, Y Specifies the entry field position. The Y origin
is the upper edge
of the entry field.(X, Y)=(0, 0) specifies the upper left corner of
the entry field area. Values increase downward and rightward.