User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 6- 7
Application Test Definition
Test Specification
Add Adds a row for the test parameter.
Delete Deletes the selected test parameter. To select the parameter, use
the left
radio button.
Up Moves the selected test parameter upward.
Down Moves the selected test parameter downward.
Properties The Properties area is used to define the following values for the specified device
parameter or test
parameter. See “Device Parameters Definition” on page 6-5 and
“Test Parameters Definition” on page 6-6.
To specify the parameter, select the radio button to the left of the parameter name.
Min For Numeric or Vector parameters. Allowable minimum value.
Max For Numeric or Vector parameters. Allowable maximum value.
Digits For Numeric or Vector parameters. Number of effective digits.
Resolution For Numeric or Vector parameters. Allowable setup resolution.
Unit For Numeric or Vector parameters. Unit of the parameter.
Typical Values... For Numeric or String parameters.
Opens the Define typical values dialog box used to define the
s
elections (typ
ical values) for the specified parameter.
The values defined here are the selections for the parameter
entry field d
isplayed on the main screen in the application test
mode. The selections for the active entry field are displayed on
the softkey. And one of the selections can be set by using the
softkey. Also, it can be set by using the Select sub menu
displayed by right-clicking the entry field.
The selections are effective for the specified parameter only.
Resource Type For Module parameters.
Opens the Define Resource Types dialog box used to specify
the type of measurem
ent resource. Multiple resouces can be set.
SMU, HPSMU, HRSMU, MPSMU, HRSMU/ASU, GNDU,
SPGU, HVSPGU, W
GFMU, RSWGFMU, MFCMU,
MFCMU/SCUU, SWM IN, SWM AUX IN, or SWM SMU IN