User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
6- 6 Agilent B1500 User’s Guide, Edition 7
Application Test Definition
Test Specification
Test Parameters
Definition
The test parameters are defined in this area.
Background Specifies a bitmap file used for the back
ground in the Test
Parameters area of the main screen.
Browse...: Opens a dialog box used to select a bitmap file.
Cancel: Returns to the default setting.
Name Test parameter name
Type Type of the test parameter, Numeric, Module, String, Vector, or
A
LWave
form (SPGU ALWG output data)
Default Default value of the parameter
For the Numeric, Vector, or ALWaveform type parameter, this
field provid
es the button to open Numeric KeyPad at the right
side.
For the Vector type parameter, this field provides the button to
open the “Define vector data (page 5-18
)” dialog box at the left
side.
For the ALWaveform type parameter, this field provides the
button to o
pen the “Define ALWG Waveform Window (page
5-64)” at the left side.
Description Description of the parameter
Align Specifies the X origin of the entry field in the main scr
een Test
Parameters area. Check this box to set it to the left edge of the
entry field. Uncheck this box to set it to the left edge of the
parameter name placed to the left of the entry field.
X, Y Specifies the entry field position. (X, Y)=(0, 0) specifies the
upper left corner of the m
ain screen Test Parameters area.
Downward and rightward are positive. See “Layout...”.
Width Specifies the width of the entry field.
Ext Do not check usually. The entry field for the parameter is put on
the main screen.
If the pa
rameter is minor and do not need changes frequently,
check the Ext ch
eck box. The entry field will be put on the
dialog box displayed by clicking the “Extended Setup (page
4-28)” button.
Layout... Opens the “Define Layout (page 6-10)” dialog box.