User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 6- 5
Application Test Definition
Test Specification
Test Specification
This setup screen is used to define the test definition information and the input
parameters for the test definition.
Test Information The test information is defined in this area.
Category Displays the category of the test definition.
The button opens a dialog box used to set the category. It must
be 1 to 30 characters. Mu
ltiple categories can be set to a test
definition.
Test Name Specifies the test definition name. It must be 1 to 30 characters.
Icon Specifies a bitmap file used for the test definition icon listed in
the Library area of the main s
creen.
Browse...: Opens a dialog box used to select a bitmap file.
Cancel: Returns to the default setting.
Description Enters the description of the test definition.
Device Parameters
Definition
The device parame
ters are defined in this area. Type of the device parameter is
Numeric.
Name Device parameter name
Default Default value of the parameter
Description Description of the parameter
Add Adds a row for the device parameter.
Delete Deletes the selected device parameter. To select the parameter,
us
e the le
ft radio button.
Up Moves the selected device parameter upward.
Down Moves the selected device parameter downward.