User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 6- 3
Application Test Definition
Test Definition Window
Test Definition Window
The Test Definition window is opened by selecting the Define New Test... function
or the Open Definition of This Test... function of the Library menu, and is used to
create a test definition used in the application test mode.
The test definition consists of the elements shown in Figure 6-1. And the Test
Definition window provides the following three tabs for creating a test definition.
• “Test Specification”
The test specification contains test name, description, device parameters, and
test paramete
rs. The parameters will be the variables used to pass the test
conditions to the test execution flow or test setup defined in the test contents.
• “Test Contents”
The test contents are the core of the test defi
nition, and defines the local
variables, test execution flow, and test setup. You can define the test setup by
selecting application tests, classic tests, or My Favorite setup, and entering the
test conditions.
• “Test Output”
The test output setup is optional. If you need the test result output (test result
display an
d record) of the test definition, declare the variables (analysis
parameters) and define the display setup.
Figure 6-1 Test Definition
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