User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 5- 59
Classic Test Definition
SPGU Pulse Setup Window
SPGU Pulse Setup Window
This window is opened by clicking the Pulse/ALWG button on the SPGU Control
screen when Mode=VPULSE, or by clicking the SPGU Pulse Setup button on the
I/V Sweep / Multi Channel I/V Sweep / I/V List Sweep / I/V-t Sampling
Measurement Setup screen. It is used to set the SPGU pulse output. See Figure 5-3
for the pulse setup parameters.
Global Settings Provides the following entry field. The setting is effective for all channels.
Period Pulse period. 20 ns to 10 s, 10 ns resolution.
Operation Provides the following radio buttons used to set the SPGU channel output operation
mo
de, free run, puls
e count, or duration. Select one of the following buttons to set
the operation mode. The setting is effective for all channels.
FREE RUN In this mode, the SPGU continues the pulse output until the
measurement is complete
d or stopped.
This mode is not available for the SPGU Control classic test.
PULSE COUNT In this mode, the SPGU outputs the specified number of pulses.
Specify a number
within the range of 1 to 1000000.
DURATION In this mode, the SPGU continues the output until the specified
time elapses. Specify a time within
the range of 1 μs to
31556926 s (1 year)
.
Pulse Settings Unit Semiconductor pulse generator unit (SPGU) used for the
v
oltage pu
lse output
VName Name of voltage output data
Type 2-Level Pulse or 3-Level Pulse. If you choose 3-Level Pulse,
the Additio
nal Pulse fields become effective.
Base, Peak Pulse base and peak voltage. 0 to ± 40 V, 1 mV r
esolution.
Delay Delay time. 0 s to Period-20 ns
, resolution 2.5 ns or 10 ns
(pulse transition time > 8 μs).
Width Pulse width. 10 ns to Period-10 ns
, resolution 2.5 ns or 10 ns
(pulse transition time > 8 μs).
Leading, Trailing Pulse transition time. 8 ns to 400 ms, resolution 2 ns or 8 ns
(pulse transitio
n time > 8 μs).