User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 5- 55
Classic Test Definition
Switching Matrix Control
Switching Matrix Control
On the EasyEXPERT main screen, click the Classic Test tab and select the
Switching Matrix Control icon. The main screen displays the Switching Matrix
Control setup screen. This setup screen is used to create the relay control setup for
Agilent B2200A/B2201A/E5250A Switching Matrix.
To apply the relay control setup, click the Single button. Before doing this, you have
to establish th
e GPIB connection to the switching matrix by using the Switching
Matrix tab screen of the Configuration window. See “Switching Matrix” on page
4-43.
Setup Name Used to set the name of the relay control setup. The name must be the identification
fo
r the se
tup saved to a My Favorite group (preset group). Enter a unique name that
is distinct from other definitions.
The name is recorded in the test result data and is used to different
iate the data in the
test record list area.
Connection This area is used to create the relay control setup for the switching matrix.
Add Adds a row for the relay connection setup.
Delete Deletes the setup row. To select the setup row, use the left radio
button.
Up Moves
the selected setup row upward.
Down Moves the selected setup row downward.
The setup row provides the following entry fields.
Operation Relay control operation
Open All, Switch Setup, Close Range, Open Output,
Op
en Range, or Ope
n Input. See Table 5-4.
Input Switching matrix input port number or label
Available for the Switch Setup, Close Range, and Open Input
operati
ons.