User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
5- 54 Agilent B1500 User’s Guide, Edition 7
Classic Test Definition
Advanced Setup Window for C-V Sweep
Advanced Setup Window for C-V Sweep
This window is opened by clicking the Advanced button on the C-V Sweep
Measurement Setup screen, and is used to set the following functions of the
MFCMU.
AC Level/DC Bias
M
onitor Settings
This ar
ea defines the variables for the AC level data and the DC bias data monitored
by the MFCMU while the capacitance measurement is performed.
Unit Module (MFCMU) used for the measurement
AC Level Monitor
Name Variab
le name of the AC level monitor data
DC Bias Monitor
Name Variab
le name of the DC bias monitor data
After Measurement
S
ettings
This
area sets the bias hold function used to keep the source output after
measurement. The source module applies the specified bias between a measurement
and the next measurement performed in the repeat measurement or quick test. See
“Bias Hold Function” on page 7-40.
Bias Hold after
Measurem
ent Bias hold function ON or OFF
Output Value after
Measurem
ent Source output value after measurement
START (sweep start value) or STOP (sweep stop value)
Semiconductor
Relays (16440A
SM
U/PG Selector)
This area sets the Agilent 16440A selector CH1/CH3 status (DEF
AULT or PGU
OPEN). To use this function, set the DEFAULT setting to Always SMU or Normally
PGU (AUX) by using the SMU/PG Selector tab screen on the Configuration window
before starting the SPGU output.
CH1 CH1 status, DEFAULT or PGU OPEN.
CH3 CH3 status, DEFAULT or PGU OPEN.
CH1 represents channel 1 on the first selector and CH3 re
presents channel 1 on the
second selector. See “SMU/PG Selector” on page 7-48 for details on the selector.
Agilent 16445A selector adapter is needed for connecting the 16440A.