User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 5- 51
Classic Test Definition
Advanced Setup Window
Advanced Setup Window
This window is opened by clicking the Advanced button on the I/V Sweep / Multi
Channel I/V Sweep / I/V List Sweep / I/V-t Sampling Measurement Setup screen,
and is used to set the following functions of the measurement channel.
Channel Settings This area sets the series resistor and the filter.
Unit Source monitor unit (SMU) used for the measurement
VName V
ariable name of voltage output or measurement data
IName Variable name of current output or measurement data
Series R Series resistor NONE or 1MOHM. See “SMU Series Resistor”
on page 7-63.
SMU Filter SMU filter ON or OFF. See “SMU Filter” on page 7-62.
Wait Time Control This area sets the source output wait time and the meas
urement wait time. See “Wait
Time” on page 7-60. The Output Wait sets the source output wait time. The
Measurement Wait sets the measurement wait time.
Factor Factor value. 0 to 10, 0.1 resolution. This is the N value show
n
in “Wait Time” on page 7-60.
After Measurement
S
ettings
This
area sets the bias hold function used to keep the source output after
measurement. The source module applies the specified bias between a measurement
and the next measurement performed in the repeat measurement or quick test. See
“Bias Hold Function” on page 7-40.
Bias Hold after
Measurem
ent Bias hold function ON or OFF
Output Value after
Measurem
ent Source output value after measurement
START (sweep start value), STOP (sweep stop value),
SOURCE (sampl
ing output source value), or BASE (sampling
output base value)