User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 5- 41
Classic Test Definition
Direct Control
compenImY
This built-in function performs compensation on the specified admittance data and
returns the imaginary data for the compensation results.
This function is effective for the CMU measurement data compensation while the
switching ma
trix is used with the CMU to extend the measurement terminals.
Define the compenReY and compenImY functions as the user functions on the
Function Setup screen as shown in Figure 5-2, so that the compensation is
performed while the Direct Control test is b
eing executed. Als
o enter the formula to
calculate the measurement parameters. For the equations, see “About Impedance
Measurements” on page 7-21. Figure 5-2 defines the following formula to calculate
capacitance.
C=ImY/(2×PI×Freq)
Syntax
compenImY(freq uency,Real,Imaginary)
Parameters frequency Measurement frequency. Hz. Numeric scalar or vector data.
For the C-f measurement data, frequency shoul
d be a vector
variable that stores multiple frequency values.
Real CMU Re(Y) measurement result data. S. Numeric vector data.
Real should be a vector variable that stores the admittance real
data befo
re compensation.
Imaginary CMU Im(Y) measurement result data. S. Numeric vector data.
Imaginary should be a vector variable that stores the admittance
imaginary data bef
ore compensation.
Example Name Bcompen
Definition compenImY(Freq,ReY,ImY)
Bcompen returns the admittance imaginary data for the compensation results.