User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

5- 34 Agilent B1500 User’s Guide, Edition 7
Classic Test Definition
Direct Control
Advanced Setup
This window is opened by clicking the Advanced button on the Direct Control
Measurement Setup screen, and is used to set the SMU series resistor, the SMU
filter, and the bias hold function.
Options The following setup is available.
Primary Setup Primary setup ON or OFF.
If Primary Setup=ON, the primary setup is applied to the instrument when the
Direct Control test
is started. For the setup condition, see “Primary Setup” on page
5-35.
If Primary Setup=OFF, the primary setup is not applied. Set the Primary Setup to
OFF if a se
tup exists and is proven to problem-free for running a test with. The test
execution time can be reduced by this setting.
Channel Settings This area sets the series resistor and the filter.
Unit Source monitor unit (SMU) used for the measurement
VName V
ariable name of voltage output or measurement data
IName Variable name of current output or measurement data
Series R Series resistor NONE or 1MOHM. See “SMU Series Resistor”
on page 7-63.
SMU Filter SMU filter ON or OFF. See “SMU Filter” on page 7-62.
After Measurement
Setting
This ar
ea sets the bias hold function for maintaining the source output after
measurement. The source module applies the specified bias between two
consecutive measurements of a repeated measurement or quick test. See “Bias Hold
Function” on page 7-40.
Bias Hold after Measurement Bias hold function ON or OFF
Semiconductor
Rela
ys (16440A
SM
U/PG Selector)
This area sets the Agilent 16440A selector CH1/CH3 status (DEF
AULT or PGU
OPEN). To use this function, set the DEFAULT setting to Always SMU or Normally
PGU (AUX) by using the SMU/PG Selector tab screen on the Configuration window
before starting the SPGU output.
CH1 CH1 status, DEFAULT or PGU OPEN.
CH3 CH3 status, DEFAULT or PGU OPEN.