User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

DECLARATION OF CONFORMITY
According to ISO/IEC Guide 22 and CEN/CENELEC EN 45014
Manufacturer’s Name:
Agilent Technologies International sarl
Manufacturer’s Address:
Supplier’s Address:
Rue de la Gare 29
CH - 1110 Morges
Switzerland
Declares under sole responsibility that the product as originally delivered
Product Name:
Semiconductor Device Analyzer
High Power Source/Monitor Unit Module,
Medium Power Source/Monitor Unit Module,
High Resolution Source/Monitor Unit Module,
Multi Frequency Capacitance Measurement Unit Module,
High Voltage Semiconductor Pulse Generator Unit Module,
Waveform Generator/Fast Measurement Unit Module
Model Number:
Agilent B1500A
Agilent B1510A, Agilent B1511A, Agilent B1517A,
Agilent B1520A, Agilent B1525A, Agilent B1530A
Product Options:
This declaration covers all options of the above product(s)
complies with the essential requirements of the following applicable European Directives, and carries
the CE marking accordingly:
Low Voltage Directive (73/23/EEC, amended by 93/68/EEC)
EMC Directive (89/336/EEC, amended by 93/68/EEC)
and conforms with the following product standards
EMC Standard
IEC 61326:2002 / EN 61326:1997 +A1:1998 +A2:2001 +A3:2003
CISPR 11:1997 / EN 55011:1998
IEC61000-4-2:1995 / EN61000-4-2:1995
IEC 61000-4-3:1995 / EN61000-4-3:1995
IEC 61000-4-4:1995 / EN61000-4-4:1995
IEC 61000-4-5:1995 / EN61000-4-5:1995
IEC 61000-4-6:1996 / EN61000-4-6:1996
IEC 61000-4-11:1994 / EN61000-4-11:1994
Canada: ICES-001:1998
Australia/New Zealand: AS/NZS 2064.1
Limit
Group 1 Class A
4 kV CD, 8 kV AD
3 V/m, 80-1000 MHz
0.5 kV signal lines, 1 kV power lines
0.5 kV line-line, 1 kV line-ground
3 V, 0.15-80 MHz
1 cycle, 100%
The product was tested in a typical configuration with Agilent Technologies test systems.
Safety
IEC 61010-1:2001 / EN 61010-1:2001
Canada: CSA C22.2 No. 1010.1:1992, NRTL/C
Supplementary Information:
This DoC applies to above-listed products placed on the EU market after:
October 01, 2008
Date
Toshiyuki Kawaji
QA Manager
Agilent Technologies