User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 5- 31
Classic Test Definition
Direct Control
Channel Setup
This setup screen is used to define the channel setups and the variables for the
channel output data, measurement data, time stamp data, and index data.
Channel Definition This area defines the channel setups and the v
ariables for th
e channel output data
and the measurement data.
Unit Module used for the source output or measurement
V Name Variable name of DC voltage output or measurement data
I Name Variable name of DC current output or measurement data
Add SMU Adds a row for the SMU channel setup.
Add CMU Adds a row for the CMU channel setup.
Add SPGU Adds a row for the SPGU channel setup.
Delete Deletes the selected channel setup. To select a channel setup,
u
se the radio
button on the left.
Up Moves the selected channel setup upward.
Down Moves the selected channel setup downward.
Additional Data
Variabl
es
This area defines the variables for the measurement data other than DC voltage and
DC current which can be defined in Channel Definition.
Unit Unit (SMU or CMU) used for the measurement
Type Type of measurement data. See Table 5-1.
Name Variable name of the measurement data
Add Adds a row for the measurement variable.
Delete Deletes the selected measurement variable. To select a variable,
u
se the radio
button on the left.
Miscellaneous
Va
riabl
es
This area defines the variables for the time stamp data and the index data.
Time Stamp Name Variable name of the time stamp. Time stamp data indicates
the time at which st
ep measurement was started.
Index Name Variable name of the data index. Integer above 0 is returned.