User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 5- 27
Classic Test Definition
C-V Sweep
Channel Setup
This setup screen is used to define the channel setups and the variables for the
channel output data, time stamp data, and index data.
Channel Definition This area defines the channel setups and the v
ariables for th
e channel output data.
Unit Module used for the source output or measurement
V Name Available for the MFCMU and the SMU used for voltage
output. V
ariable name of voltage output data
I Name Available for the SMU used for current output. Variable name
of curren
t output data.
Mode SMU output mode, V (voltage), I (current), or COMMON
(ground)
Add Adds
a row for the channel setup.
Delete Deletes the channel setup. To select the channel setup, use the
left radi
o button.
Up Moves the selected channel setup upward.
Down Moves the selected channel setup downward.
If multiple output channels are defined, the channels start output sequentially. The
o
rder is
top to bottom of the channels defined in this screen. However the last output
channel is always the MFCMU. The output stops in the opposite order.
Miscellaneous
Va
riabl
es
This area defines the variables for the time stamp data and the index data.
Time Stamp Name Variable name of the time stamp. Time stamp data gives the
time when step measurem
ent is started.
Index Name Variable name of the data index. Integer above 0 is returned.