User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

5- 24 Agilent B1500 User’s Guide, Edition 7
Classic Test Definition
I/V-t Sampling
Base Hold Time Hold time of the Base value output until the Source value
output, in seconds. 0 to 655.35 s, resolution 0.01 s.
Stop Condition This area defines the sampling measurement stop condition. See “Stop Condition”
on page 7-18 for this function.
Enable/Disable Enables or disables the stop condition.
Enable Delay Delay time. in second. This is the time from starting sampling
measurement to
enabling this function.
Name Name of measurement data or user function to monitor for stop
condition.
Val of Event.
Threshold Threshold value at which to stop sampling measurement.
Th of Event.
Event Event for stop condition.
Val > Th True if Name parameter value is greater
than Thresh
old value.
Val < Th True if Name parameter value is less than
Threshold value.
|V
al| > |Th| True if absolute Name parameter value is
greater than absolute T
hreshold value.
|Val| < |Th| True if absolute Name parameter value is
less than abso
lute Threshold value.
No. of Events Target value of the count the event occurs (
true). When the
count of true is this value, sampling is immediately stopped.
Constants This area defines the constant voltage/current source.
Unit Source monitor unit (SMU) used for the constant source
V Name Variable name for the constant voltage output or measurement
data
I Name Va
riable name for the constant current output or
measurement
data
Mode Output mode, V (voltage), or I (current)
Base, Source Base or Source value, in V or A.
0 to ±100 V (HRSMU/MPSMU) or ±200 V (HPSMU)
0 to ±0.1 A (HRSMU/MPSMU) or ±1 A (HPSMU)