User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 5- 23
Classic Test Definition
I/V-t Sampling
Measurement Setup
This setup screen is used to set the sampling timing parameters, constant
voltage/current outputs, and so on.
Sampling
Pa
rameter
This
area defines the sampling timing parameters.
Linear/Log Sampling mode. LINEAR for linear sampling. LOG10,
LOG25, LOG50,
LOG100, LOG250, or LOG500 for
logarithmic sampling.
For the logarithmic sampling, the number after
LOG indicates
the number of measurement data in a decade. For example,
LOG10 mode is used to get 10 data/decade.
Interval Interval of the sampling, in seconds. 0.002 to 65.535 s, 0.001 s
resolutio
n.
Interval < 0.002 s in 0.00001 s resolution is also available for
the lin
ear sampling. It must satisfy the following formula. See
NOTE on page 5-21.
Interval ≥ 0.0001 + 0.00002 × (number of measur
ement
channels-1)
No of Samples Number of samples. Integer. 1 to the following value.
For linear: 100001 / (number of measurement channels)
For logarithmic: 1 + (number of data for 11 decades)
Total Sampling
Ti
me This
field just displays the total sampling time that is the time
from the measurement st
art time for the first point to the end of
sampling measurement. It does not include the hold time.
Total Sampling Time = Interval × No
of Samples
Output Sequence Source output sequence. SIMULTANEOUS or SEQUENTIAL.
See “Source Output Sequence and Time Origin” on page 7-18.
Hold Time Time since the Source value out
put until the first sampling
point, in seconds. 0 to 655.35 s, resolution 0.01 s.
The following values are also available for Interval < 0
.002 s.
|Hold Time| will be the time since the sampling start until the
Source value output.
-0.09 to -0.0001 s, resolution 0.0001 s.