User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 5- 21
Classic Test Definition
I/V-t Sampling
I/V-t Sampling
On the EasyEXPERT main screen, click the Classic Test tab and select the I/V-t
Sampling icon. The main screen displays the I/V-t sampling test setup screen. For
details of the measurement mode, see “I/V-t Sampling Measurement” on page 7-13.
Setup Name Used to set the name of test setup. The name must be the identification for the test
s
etup save
d to a My Favorite group (preset group). Enter a unique name that is
distinct from other definitions.
The name is recorded in the test result data and is used to different
iate the data in the
test record list area.
Channel Setup This tab displays the Channel Setup screen. See “Channel Setup” on page 5-22.
Measurement
Se
tup
This tab d
isplays the Measurement Setup screen. See “Measurement Setup” on page
5-23.
Function Setup This tab displays the Function Setup screen. See “Function Setup” on page 5-42.
Auto Analysis
Se
tup
This tab
displays the Auto Analysis Setup screen. See “Auto Analysis Setup” on
page 5-43.
Display Setup This tab displays the Display Setup screen. See “Display Setup” on page 5-46.
NOTE If you set Interval < 0.002 s
Sampling mode must be linear. This setting is not permitted for the log sampling.
All measurement channels must use the high speed A/D con
verter (ADC). This
setting is not permitted if a measurement channel uses the high resolution ADC.
If the multiple measurement channels are used, all channe
ls perform measurement
in parallel.
If the measurement ranging mode is not the fixed mode, the meas
urement channels
automatically select the minimum range that covers compliance value set to the
channel.
If the measurement time is expected to be longer t
han Interval, the measurement
channels automatically adjust the number of averaging samples (ADC settings) to
keep the sampling interval.